"New experimental findings on hot-carrier-induced degradation in lateral ..."

In Kyung Lee et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.071

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type: Journal Article

metadata version: 2022-10-02

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In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong Tae Park:
New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors. Microelectron. Reliab. 46(9-11): 1864-1867 (2006)

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