default search action
"Concurrent PBTI and hot carrier degradation in n-channel MuGFETs."
Seung Min Lee et al. (2011)
- Seung Min Lee, Dong Hun Lee, Jae Ki Lee, Jong Tae Park:
Concurrent PBTI and hot carrier degradation in n-channel MuGFETs. Microelectron. Reliab. 51(9-11): 1544-1546 (2011)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.