"Effects of hot carrier stress on the RF performance in SOI MOSFETs."

Byung-Jin Lee, Kyosun Kim, Jong Tae Park (2004)

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DOI: 10.1016/J.MICROREL.2004.07.083

access: closed

type: Journal Article

metadata version: 2022-04-22

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Byung-Jin Lee, Kyosun Kim, Jong Tae Park:
Effects of hot carrier stress on the RF performance in SOI MOSFETs. Microelectron. Reliab. 44(9-11): 1637-1642 (2004)

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