"Impact of back gate biases on hot carrier effects in multiple gate ..."

Seung Min Lee, Hyun Jun Jang, Jong Tae Park (2013)

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DOI: 10.1016/J.MICROREL.2013.07.009

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type: Journal Article

metadata version: 2022-04-21

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Seung Min Lee, Hyun Jun Jang, Jong Tae Park:
Impact of back gate biases on hot carrier effects in multiple gate junctionless transistors. Microelectron. Reliab. 53(9-11): 1329-1332 (2013)

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