"NBTI and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs."

Chi-Woo Lee et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.06.011

access: closed

type: Journal Article

metadata version: 2022-04-22

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Chi-Woo Lee, Isabelle Ferain, Aryan Afzalian, Ran Yan, Nima Dehdashti, Pedram Razavi, Jean-Pierre Colinge, Jong Tae Park:
NBTI and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs. Microelectron. Reliab. 49(9-11): 1044-1047 (2009)

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