"Elimination of surface state induced edge transistors in high voltage ..."

Jin-Wook Lee et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.035

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jin-Wook Lee, Gyoung Ho Buh, Guk-Hyon Yon, Tai-su Park, Yu Gyun Shin, U-In Chung, Joo Tae Moon:
Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices. Microelectron. Reliab. 45(9-11): 1394-1397 (2005)

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