"Signal characteristic and test exploitation for intermittent ..."

Hosung Lee, Sanghyeon Baeg (2018)

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DOI: 10.1016/J.MICROREL.2018.03.001

access: closed

type: Journal Article

metadata version: 2021-12-25

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Hosung Lee, Sanghyeon Baeg:
Signal characteristic and test exploitation for intermittent nanometer-scale cracks. Microelectron. Reliab. 84: 26-36 (2018)

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