"Effects of different test profiles of temperature cycling tests on the ..."

Sanna Lahokallio, Kirsi Saarinen-Pulli, Laura Frisk (2015)

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DOI: 10.1016/J.MICROREL.2014.09.032

access: closed

type: Journal Article

metadata version: 2020-02-22

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Sanna Lahokallio, Kirsi Saarinen-Pulli, Laura Frisk:
Effects of different test profiles of temperature cycling tests on the reliability of RFID tags. Microelectron. Reliab. 55(1): 93-100 (2015)

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