"Dynamic behavior of resistive faults in nanometer technology."

Mayuri Kunchwar, Reza Sedaghat, Vadim Geurkov (2007)

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DOI: 10.1016/J.MICROREL.2007.01.081

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mayuri Kunchwar, Reza Sedaghat, Vadim Geurkov:
Dynamic behavior of resistive faults in nanometer technology. Microelectron. Reliab. 47(12): 2141-2146 (2007)

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