"Influence of bias humidity testing and application on time-dependent, ..."

Reiner W. Kuehl (2014)

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DOI: 10.1016/J.MICROREL.2014.02.027

access: closed

type: Journal Article

metadata version: 2020-02-22

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Reiner W. Kuehl:
Influence of bias humidity testing and application on time-dependent, Arrhenius-law-based stability predictions for thin film resistors. Microelectron. Reliab. 54(6-7): 1316-1327 (2014)

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