"Reliability of thin-film resistors: impact of third harmonic screenings."

Reiner W. Kuehl (2002)

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DOI: 10.1016/S0026-2714(02)00012-4

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type: Journal Article

metadata version: 2020-02-22

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Reiner W. Kuehl:
Reliability of thin-film resistors: impact of third harmonic screenings. Microelectron. Reliab. 42(6): 807-813 (2002)

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