"PMOS breakdown effects on digital circuits - Modeling and analysis."

Weidong Kuang et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.019

access: closed

type: Journal Article

metadata version: 2021-12-10

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Weidong Kuang, Lizhi Cao, Chuanzhao Yu, Jiann-Shiun Yuan:
PMOS breakdown effects on digital circuits - Modeling and analysis. Microelectron. Reliab. 48(8-9): 1597-1600 (2008)

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