"Reliability of key technologies in 3D integration."

Cheng-Ta Ko, Kuan-Neng Chen (2013)

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DOI: 10.1016/J.MICROREL.2012.08.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Cheng-Ta Ko, Kuan-Neng Chen:
Reliability of key technologies in 3D integration. Microelectron. Reliab. 53(1): 7-16 (2013)

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