"A compact model for NBTI degradation and recovery under use-profile ..."

Veit B. Kleeberger et al. (2014)

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DOI: 10.1016/J.MICROREL.2013.12.002

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type: Journal Article

metadata version: 2024-10-06

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Veit B. Kleeberger, Martin Barke, Christoph Werner, Doris Schmitt-Landsiedel, Ulf Schlichtmann:
A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits. Microelectron. Reliab. 54(6-7): 1083-1089 (2014)

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