"Hot electron induced degradation of undoped AlGaN/GaN HFETs."

Hyungtak Kim et al. (2003)

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DOI: 10.1016/S0026-2714(03)00066-0

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type: Journal Article

metadata version: 2020-03-27

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Hyungtak Kim, Alexei Vertiatchikh, Richard M. Thompson, Vinayak Tilak, Thomas R. Prunty, James R. Shealy, Lester F. Eastman:
Hot electron induced degradation of undoped AlGaN/GaN HFETs. Microelectron. Reliab. 43(6): 823-827 (2003)

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