"Reliability functions estimated from commonly used yield models."

Kyungmee O. Kim, Hee-Seok Oh (2008)

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DOI: 10.1016/J.MICROREL.2007.08.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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Kyungmee O. Kim, Hee-Seok Oh:
Reliability functions estimated from commonly used yield models. Microelectron. Reliab. 48(3): 481-489 (2008)

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