"Analysis of retention tail distribution induced by scaled shallow trench ..."

Young Pil Kim et al. (2001)

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DOI: 10.1016/S0026-2714(01)00192-5

access: closed

type: Journal Article

metadata version: 2020-02-22

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Young Pil Kim, Beom Jun Jin, Young Wook Park, Joo Tae Moon, Sang U. Kim:
Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs. Microelectron. Reliab. 41(9-10): 1301-1305 (2001)

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