"Electrical analysis of DRAM cell transistors for the root-cause addressing ..."

Young Pil Kim et al. (2003)

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DOI: 10.1016/S0026-2714(03)00259-2

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type: Journal Article

metadata version: 2020-02-22

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Young Pil Kim, U-In Chung, Joo Tae Moon, Sang U. Kim:
Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. Microelectron. Reliab. 43(9-11): 1461-1464 (2003)

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