"Determination of the stress level for voltage screen of integrated circuits."

Ramun M. Kho et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.103

access: closed

type: Journal Article

metadata version: 2020-05-19

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Ramun M. Kho, A. J. Moonen, V. M. Girault, Jaap Bisschop, E. H. T. Olthof, S. Nath, Z. N. Liang:
Determination of the stress level for voltage screen of integrated circuits. Microelectron. Reliab. 50(9-11): 1210-1214 (2010)

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