"Reliability screening of high-k dielectrics based on voltage ramp stress."

A. Kerber et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.030

access: closed

type: Journal Article

metadata version: 2020-10-09

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A. Kerber, Luigi Pantisano, Anabela Veloso, Guido Groeseneken, Martin Kerber:
Reliability screening of high-k dielectrics based on voltage ramp stress. Microelectron. Reliab. 47(4-5): 513-517 (2007)

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