"Overview on ESD protection design for mixed-voltage I/O interfaces with ..."

Ming-Dou Ker, Wei-Jen Chang (2007)

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DOI: 10.1016/J.MICROREL.2006.03.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ming-Dou Ker, Wei-Jen Chang:
Overview on ESD protection design for mixed-voltage I/O interfaces with high-voltage-tolerant power-rail ESD clamp circuits in low-voltage thin-oxide CMOS technology. Microelectron. Reliab. 47(1): 27-35 (2007)

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