"Non-destructive estimation method on cosmic ray ruggedness of power ..."

C. Kawahara et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.147

access: closed

type: Journal Article

metadata version: 2020-02-22

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C. Kawahara, Y. Wada, S. Kinouchi, H. Kobayashi:
Non-destructive estimation method on cosmic ray ruggedness of power semiconductors using repetitive monitoring technique. Microelectron. Reliab. 88-90: 957-960 (2018)

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