"Degradation analysis and current collapse imaging of AlGaN/GaN HEMTs by ..."

Takashi Katsuno et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.025

access: closed

type: Journal Article

metadata version: 2020-02-22

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Takashi Katsuno, Takaaki Manaka, Tsuyoshi Ishikawa, Hiroyuki Ueda, Tsutomu Uesugi, Mitsumasa Iwamoto:
Degradation analysis and current collapse imaging of AlGaN/GaN HEMTs by measurement of electric field-induced optical second-harmonic generation. Microelectron. Reliab. 54(9-10): 2227-2231 (2014)

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