"Characterising gate dielectrics in high mobility devices using novel ..."

Raman Kapoor et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.124

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type: Journal Article

metadata version: 2024-07-20

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Raman Kapoor, Enrique Escobedo-Cousin, S. H. Olsen, Steve J. Bull:
Characterising gate dielectrics in high mobility devices using novel nanoscale techniques. Microelectron. Reliab. 50(9-11): 1484-1487 (2010)

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