"An efficient temperature dependent hot carrier injection reliability ..."

Mehdi Kamal et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.12.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mehdi Kamal, Qing Xie, Massoud Pedram, Ali Afzali-Kusha, Saeed Safari:
An efficient temperature dependent hot carrier injection reliability simulation flow. Microelectron. Reliab. 57: 10-19 (2016)

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