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"Transient stress characterization of AlGaN/GaN HEMTs due to electrical and ..."
Jason P. Jones et al. (2015)
- Jason P. Jones, Eric Heller, Donald Dorsey
, Samuel Graham:
Transient stress characterization of AlGaN/GaN HEMTs due to electrical and thermal effects. Microelectron. Reliab. 55(12): 2634-2639 (2015)
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