"The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs."

B. K. Jones et al. (2001)

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DOI: 10.1016/S0026-2714(00)00077-9

access: closed

type: Journal Article

metadata version: 2020-02-22

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B. K. Jones, C. N. Graham, A. Konczakowska, L. Hasse:
The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. Microelectron. Reliab. 41(1): 87-97 (2001)

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