"Single-bit failure analysis at a nanometer resolution by conductive atomic ..."

Yong Jiang, Li-Lung Lai, Jian-Jun Zhou (2012)

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DOI: 10.1016/J.MICROREL.2011.08.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yong Jiang, Li-Lung Lai, Jian-Jun Zhou:
Single-bit failure analysis at a nanometer resolution by conductive atomic force microscopy. Microelectron. Reliab. 52(1): 159-164 (2012)

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