"Experimental evaluation of hot electron reliability on differential Clapp-VCO."

S. L. Jang et al. (2013)

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DOI: 10.1016/J.MICROREL.2012.08.004

access: closed

type: Journal Article

metadata version: 2024-01-19

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S. L. Jang, Jiann-Shiun Yuan, S. D. Yen, E. Kritchanchai, G. W. Huang:
Experimental evaluation of hot electron reliability on differential Clapp-VCO. Microelectron. Reliab. 53(2): 254-258 (2013)

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