"Reliability of a stretchable interconnect utilizing terminated, in-plane ..."

Michal Jablonski et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.04.002

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type: Journal Article

metadata version: 2024-02-05

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Michal Jablonski, Frederick Bossuyt, Jan Vanfleteren, Thomas Vervust, H. de Vries:
Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor. Microelectron. Reliab. 53(7): 956-963 (2013)

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