"Studies of the quality of GdSiO-Si interface."

Marcin Iwanowicz et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.03.006

access: closed

type: Journal Article

metadata version: 2023-09-30

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Marcin Iwanowicz, Jakub Jasinski, Grzegorz Gluszko, Lidia Lukasiak, Andrzej Jakubowski, Heinrich Gottlob, Mathias Schmidt:
Studies of the quality of GdSiO-Si interface. Microelectron. Reliab. 51(7): 1178-1182 (2011)

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