"Module allocation with idle-time utilization for on-line testability."

Asad A. Ismaeel, Rajan Mathew, R. Bhatnagar (2001)

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DOI: 10.1016/S0026-2714(00)00078-0

access: closed

type: Journal Article

metadata version: 2020-02-22

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Asad A. Ismaeel, Rajan Mathew, R. Bhatnagar:
Module allocation with idle-time utilization for on-line testability. Microelectron. Reliab. 41(2): 323-332 (2001)

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