"A bottom-up approach for System-On-Chip reliability."

Vincent Huard et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.086

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type: Journal Article

metadata version: 2020-02-22

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Vincent Huard, N. Ruiz Amador, Florian Cacho, E. Pion:
A bottom-up approach for System-On-Chip reliability. Microelectron. Reliab. 51(9-11): 1425-1439 (2011)

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