"Temperature monitoring inside IGBT modules at forward bias from the cross ..."

Yongle Huang et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.03.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yongle Huang, Yifei Luo, Fei Xiao, Binli Liu:
Temperature monitoring inside IGBT modules at forward bias from the cross section and its finite element analysis. Microelectron. Reliab. 83: 187-197 (2018)

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