"Analysis of the gate capacitance measurement technique and its application ..."

C. T. Hsu, M. M. Lau, Y. T. Yeow (2001)

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DOI: 10.1016/S0026-2714(00)00222-5

access: closed

type: Journal Article

metadata version: 2020-02-22

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C. T. Hsu, M. M. Lau, Y. T. Yeow:
Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs. Microelectron. Reliab. 41(2): 201-209 (2001)

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