"Low-capacitance ESD protection design for high-speed I/O interfaces in a ..."

Yuan-Wen Hsiao, Ming-Dou Ker (2009)

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DOI: 10.1016/J.MICROREL.2009.03.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yuan-Wen Hsiao, Ming-Dou Ker:
Low-capacitance ESD protection design for high-speed I/O interfaces in a 130-nm CMOS process. Microelectron. Reliab. 49(6): 650-659 (2009)

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