"Performance and reliability improvement of flash device by a novel ..."

Chia-Huai Ho et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.06.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chia-Huai Ho, Kuei-Shu Chang-Liao, Ya-Nan Huang, Tien-Ko Wang, T. C. Lu:
Performance and reliability improvement of flash device by a novel programming method. Microelectron. Reliab. 47(6): 967-971 (2007)

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