"Degradation mechanisms of GaAs PHEMTs in high humidity conditions."

Takayuki Hisaka et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.01.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Takayuki Hisaka, Yasuki Aihara, Yoichi Nogami, Hajime Sasaki, Yasushi Uehara, Naohito Yoshida, Kazuo Hayashi:
Degradation mechanisms of GaAs PHEMTs in high humidity conditions. Microelectron. Reliab. 45(12): 1894-1900 (2005)

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