"Evaluation of effective stress times and stress levels from mission ..."

Alexander Hirler et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.022

access: closed

type: Journal Article

metadata version: 2024-07-28

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Alexander Hirler, Josef Biba, Adnan Alsioufy, T. Lehndorff, Torsten Sulima, H. Lochner, U. Abelein, Walter Hansch:
Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability. Microelectron. Reliab. 76-77: 38-41 (2017)

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