"NBTI degradation in STI-based LDMOSFETs."

Yandong He, Ganggang Zhang, Xing Zhang (2014)

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DOI: 10.1016/J.MICROREL.2014.07.029

access: closed

type: Journal Article

metadata version: 2021-02-14

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Yandong He, Ganggang Zhang, Xing Zhang:
NBTI degradation in STI-based LDMOSFETs. Microelectron. Reliab. 54(9-10): 1940-1943 (2014)

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