"Impact on the back gate degradation in partially depleted SOI n-MOSFETs by ..."

Kiyoteru Hayama et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.063

access: closed

type: Journal Article

metadata version: 2020-02-22

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Kiyoteru Hayama, Kenichiro Takakura, K. Shigaki, Hidenori Ohyama, Joan Marc Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys:
Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. Microelectron. Reliab. 46(9-11): 1731-1735 (2006)

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