"The impact of high-frequency characteristics induced by intrinsic ..."

Ming-Hung Han, Yiming Li, Chih-Hong Hwang (2010)

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DOI: 10.1016/J.MICROREL.2010.01.048

access: closed

type: Journal Article

metadata version: 2023-02-24

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Ming-Hung Han, Yiming Li, Chih-Hong Hwang:
The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit. Microelectron. Reliab. 50(5): 657-661 (2010)

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