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"Bias temperature instability and condition monitoring in SiC power MOSFETs."

Jose Angel Ortiz Gonzalez, Olayiwola Alatise (2018)

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DOI: 10.1016/J.MICROREL.2018.06.045

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mr/GonzalezA18
Jose Angel Ortiz Gonzalez, Olayiwola Alatise:
Bias temperature instability and condition monitoring in SiC power MOSFETs. Microelectron. Reliab. 88-90: 557-562 (2018)

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