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"Reservoir effect in SiCN capped copper/SiO2 interconnects."
Valerie Girault, F. Terrier, D. Ney (2008)
- Valerie Girault, F. Terrier, D. Ney:
Reservoir effect in SiCN capped copper/SiO2 interconnects. Microelectron. Reliab. 48(2): 219-224 (2008)
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