"Charge-related phenomena and reliability of non-volatile memories."

G. Ghidini (2012)

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DOI: 10.1016/J.MICROREL.2012.06.109

access: closed

type: Journal Article

metadata version: 2020-02-22

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G. Ghidini:
Charge-related phenomena and reliability of non-volatile memories. Microelectron. Reliab. 52(9-10): 1876-1882 (2012)

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