"Magnetic Field Imaging for non destructive 3D IC testing."

Jan Gaudestad, Antonio Orozco (2014)

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DOI: 10.1016/J.MICROREL.2014.07.080

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jan Gaudestad, Antonio Orozco:
Magnetic Field Imaging for non destructive 3D IC testing. Microelectron. Reliab. 54(9-10): 2093-2098 (2014)

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