"Wafer level measurements and numerical analysis of self-heating phenomena ..."

Giacomo Garegnani et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.03.007

access: closed

type: Journal Article

metadata version: 2021-10-14

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Giacomo Garegnani, Vincent Fiori, Gilles Gouget, Frederic Monsieur, Clément Tavernier:
Wafer level measurements and numerical analysis of self-heating phenomena in nano-scale SOI MOSFETs. Microelectron. Reliab. 63: 90-96 (2016)

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