"A unified look at the use of successive differentiation and integration in ..."

Francisco J. García-Sánchez et al. (2015)

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DOI: 10.1016/J.MICROREL.2014.11.013

access: closed

type: Journal Article

metadata version: 2020-12-29

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Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci, Andrea Sucre-González, Juin J. Liou:
A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction. Microelectron. Reliab. 55(2): 293-307 (2015)

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