"The effects of buffer thickness on GaAs MESFET characteristics: ..."

Frank Gao, Ravi Chanana, Tom Nicholls (2002)

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DOI: 10.1016/S0026-2714(02)00064-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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Frank Gao, Ravi Chanana, Tom Nicholls:
The effects of buffer thickness on GaAs MESFET characteristics: channel-substrate current, drain breakdown, and reliability. Microelectron. Reliab. 42(7): 1003-1010 (2002)

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