"ATPG scan logic failure analysis: a case study of logic ICs - fault ..."

Liming Gao, Christian Burmer, Frank Siegelin (2006)

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DOI: 10.1016/J.MICROREL.2006.07.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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Liming Gao, Christian Burmer, Frank Siegelin:
ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement. Microelectron. Reliab. 46(9-11): 1458-1463 (2006)

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